Profiling the Interface Electron Gas of <span class="aps-inline-formula"><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><msub><mi>LaAlO</mi><mn>3</mn></msub><mo>/</mo><msub><mi>SrTiO</mi><mn>3</mn></msub></math></span> Heterostructures with Hard X-Ray Photoelectron Spectroscopy

M. Sing; G. Berner; K. Goß; A. Müller; A. Ruff; A. Wetscherek; S. Thiel; J. Mannhart; S. A. Pauli; C. W. Schneider; P. R. Willmott; M. Gorgoi; F. Schäfers; R. Claessen

doi:10.1103/PhysRevLett.102.176805

Profiling the Interface Electron Gas of ${LaAlO}_{3} / {SrTiO}_{3}$ Heterostructures with Hard X-Ray Photoelectron Spectroscopy

M. Sing¹, G. Berner¹, K. Goß¹, A. Müller¹, A. Ruff¹, A. Wetscherek¹, S. Thiel², J. Mannhart², S. A. Pauli³ et al.

C. W. Schneider³, P. R. Willmott³, M. Gorgoi⁴, F. Schäfers⁴, and R. Claessen¹

¹Experimentelle Physik 4, Universität Würzburg, Am Hubland, D-97074 Würzburg, Germany
²Institute of Physics, Universität Augsburg, Electronic Correlations and Magnetism, Experimentalphysik VI, Universitätsstrasse 1, D-86135 Augsburg, Germany
³Paul Scherrer Institut, CH-5232 Villigen, Switzerland
⁴Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung m.b.H., Albert-Einstein-Strasse 15, D-12489 Berlin, Germany

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Phys. Rev. Lett. 102, 176805 – Published 30 April, 2009

DOI: https://doi.org/10.1103/PhysRevLett.102.176805

Abstract

The conducting interface of ${LaAlO}_{3} / {SrTiO}_{3}$ heterostructures has been studied by hard x-ray photoelectron spectroscopy. From the Ti $2 p$ signal and its angle dependence we derive that the thickness of the electron gas is much smaller than the probing depth of 4 nm and that the carrier densities vary with increasing number of ${LaAlO}_{3}$ overlayers. Our results point to an electronic reconstruction in the ${LaAlO}_{3}$ overlayer as the driving mechanism for the conducting interface and corroborate the recent interpretation of the superconducting ground state as being of the Berezinskii-Kosterlitz-Thouless type.

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Profiling the Interface Electron Gas of ${LaAlO}_{3} / {SrTiO}_{3}$ Heterostructures with Hard X-Ray Photoelectron Spectroscopy

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Profiling the Interface Electron Gas of LaAlO3/SrTiO3 Heterostructures with Hard X-Ray Photoelectron Spectroscopy

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Profiling the Interface Electron Gas of ${LaAlO}_{3} / {SrTiO}_{3}$ Heterostructures with Hard X-Ray Photoelectron Spectroscopy